Practical electronic fault finding and troubleshooting. Abstracthe problem of designing test schedules for the testing or diagnosis of a small number of nontransient faults in combinational digital circuits switching networks is considered in detail. Diagnosis of combinational logic circuits using boolean. Fault testing and diagnosis in combinational digital circuits. Electrical measurement and fault diagnosis notes pdf. A combinational logic circuit is a circuit whose outputs only depend on the current state of its inputs. Diagnosis, the determination of the location of the defect causing. The set of prime faults chosen by the procedure outlined above is not necessarily minimal. Friedman, digital systems and testable design, jaico publishing house,2002. Current testing of cmos combinational circuits with single floating gate defects current testing of cmos combinational circuits with single floating gate defects.
Pdf fault detection and test minimization methods for. Fault diagnosis for combinational circuits selfchecking design system level diagnosis. First, nominal and faulty response waveforms of a circuit are measured, respectively, and then are decomposed into intrinsic mode functions imfs with the eemd method. Abul masrur, senior member, ieee, zhihang chen, and yi lu murphey, senior member, ieee us army rdecomtardec, warren, mi 48397, usa email. The output of combinational circuit at any instant of time, depends only on the levels present at input terminals. Pdf multiple fault diagnosis in combinational circuits. So, verifying the timing behavior of digital circuits is always necessary, and needs to test for delay faults. This article describes an emulationbased method for locating stuckat faults in combinational and synchronous sequential circuits. New approach framework in this paper we presented a new approach to design faulttolerant combinational circuits. Assume a logic circuit with minput and noutput lines. A fault detection method for combinational circuits. The circuitry identifies sensitive gates of the circuit that require protection from at least one of a first type of fault and a second type of fault. Removal of redundancy in combinational circuits under. Digital electronics part i combinational and sequential.
Prime faults are introduced for the study of multiple fault diagnosis in combinational circuits. Logic gates are the simplest combinational circuits. Design of selftesting and online fault detection combinational. A combinational circuit consists of input variables n, logic gates, and output variables m. It is shown that every multiple fault in a network can be represented. Fault diagnosis is the process of tracing a fault by means of its symptoms, applying knowledge, and analyzing test results. Dynamic fault diagnosis of combinational and sequential. Multiple fault diagnosis in combinational circuits based on an effectcause analysis. The main vehicle of our approach is the deduction of internal line values in a circuit under test n. Fault detection and test minimization methods for combinational circuits a survey. An efficient logical fault diagnosis for combinational. Pdf a tsc evaluation function for combinational circuits. Some of the characteristics of combinational circuits are following.
Dudam2 amit kumar sinha3 1,2,3department of vlsi design 1,3vel tech university, chennai, india 2pune institute of computer technology, pune abstractin any circuit that comprises the logic gates. Kohavi, detection of multiple faults in combinational logic networks, ieee trans. This paper presents a novel fault diagnosis method for analog circuits using ensemble empirical mode decomposition eemd, relative entropy, and extreme learning machine elm. A tracebased method for delay fault diagnosis in synchronous sequential circuits. Home conferences edtc proceedings edtc 95 a tracebased method for delay fault diagnosis in synchronous sequential circuits. When a delay fault has been detected, a specific diagnostic method is required to locate the site of the fault in the circuit. Kajihara is a member of the institute of information processing of japan, the institute of electronics, information and communication. Sinclair electronics fault diagnosis fountain press argus books ltd. For n input variables there are 2n possible combinations of binary input values. In this section we look at the general principles of fault finding through the application of diagnostic reporting. These principles apply in all disciplines regardless of whether they are civil, electrical, mechanical etc. Multiple fault diagnosis in combinational circuits based. Principles of systematic fault diagnosis diagnosis of faults requires a logical and disciplined approach. Practical electronic fault finding and troubleshooting top results of your surfing practical electronic fault finding and troubleshooting start download portable document format pdf and ebooks electronic books free online rating news 20162017 is books that can provide inspiration, insight, knowledge to the reader.
Compaction of passfailbased diagnostic test vectors for. Introduction and basic principles introduction boolean algebra number systems combinational logic introduction sum of products representation the negative logic approach minimalisation common combinational circuits the 4bit adder. The compaction of diagnostic test vectors must take care of all fault pairs that need to be distinguished by a given test vector set. Aiming to provide comprehensive coverage of all aspects of fault diagnosis in the digital circuits, this study focuses on the use of uptodate online testing techniques for. For each possible input combination there is one and only one possible output combination, a combinational circuit can be. Abstractreversible circuits rely on an entirely different computing paradigm allowing to perform computations not only. There is a generally recognised method of approaching faultfinding. Intelligent diagnosis of open and short circuit faults in.
Described herein is a method implemented by circuitry for providing fault tolerance in a combinational circuit. A thesis in electrical engineering submitted to the graduate faculty of texas tech university in partial fulfillment of the requirements for the degree of master of science in electrical engineering approved c accepted may, 1975. Fault tolerant design of combinational and sequential. Further, circuitry computes for each first type of transistor included in the sensitive gate, a first failure probability, and for. These functions can be described using logic expressions, but is most often at least initially using truth tables. Catastrophic fault diagnosis of a certain class of. This technique allows simulation and test generation for the modeled fault by any singlefault simulator or test generator. His fields of interest are test genrations and fault diagnosis of logic circuits. A method is developed for obtaining a highly compressed fault table for twolevel combinational circuits. Abadir3 sep seyedi1 abstract fault equivalence is an essential concept in digital design with signi. Multiple fault diagnosis in combinational circuits 357 two heuristics can be employed to enhance the fault detection capability of a test generated in step 2 of the algorithm presented above.
To improve the ability of fault diagnosis, our method uses the logic values of lines and the. This method can localize a single logic function fault, which is caused by internal stuckat, short or open faults in the gate or function block, by using. A new efficient method to diagnose faults in a gate or function block is proposed. Multiple fault diagnosis in combinational circuits. Digital integrated circuits combinational logic prentice hall 1995 combinational logic. Boolean derivative calculation with application to fault detection of. Agrawal the objective of the research reported in this thesis is to develop new test generation algorithms using mathematical optimization techniques. Fault diagnosis of combinational circuits by conventional methods. Accurate diagnosis of faults in complex engineering systems requires acquiring the information through sensors, processing the information using advanced signal processing algorithms, and extracting required features for.
International journal of computer trends and technology volume2issue2 2011 fault detection and test minimization methods for combinational circuits a. Diagnosing delay faults in combinational circuits under the ambiguous delay model. Fault detection in combinational circuits using a compressed fault table. Multiple fault diagnosis in combinational circuits sciencedirect. An efficient logical fault diagnosis for combinational circuits using stuckat fault simulation abstract. The knowledge of these values allows us to identify fault situations in n causes which are compatible with the applied test and the obtained response the effect. The single stuckat fault has previously being used. Combinational circuit is a circuit in which we combine the different gates in the circuit, for example encoder, decoder, multiplexer and demultiplexer. Ieee transactions on reliability, 44 2, 302 june 1995. Experimental section1 you will build an adder using 7400nand and 7402nor gates, as an example of combinational logic circuit. Multiple fault detection in twolevel multioutput circuits springerlink. Fault modeling of ecl for high fault coverage of physical defects fault.
Fault diagnosis of digital circuits book, 1990 worldcat. University of california santa cruz comprehensive fault diagnosis of combinational circuits a dissertation submitted in partial satisfaction of the requirements for the degree of doctor of philosophy in computer engineering by david b. Combinational circuits are logic circuits whose outputs respond immediately to the inputs. Yet, the compaction of test vectors for fault diagnosis is little explored. A tool for singlefault diagnosis in linear analog circuits with tolerance using the tvector approach. Pdf diagnosing delay faults in combinational circuits. Multiple fault diagnosis in combinational circuits multiple fault diagnosis in combinational circuits 19970301 00. In a sequential logic circuit the outputs depend on the inputs plus its history. Consequently the output is solely a function of the current inputs. Diagnosis by uut reduction fault diagnosis for combinational circuits selfchecking design system level diagnosis.
In this paper we present a new approach to multiple fault diagnosis in combinational circuits based on an effectcause analysis. In our case, we consider that a fault is easier to observe when it is closer to a. Abstract abstractwe propose an emulationbased diagnosis technique for combinational circuits in this paper. Pdf a fault detection method for combinational circuits. So, a reliable method for delay fault diagnosis is proposed in this paper.
Fault detection in logical circuits by samprakash majumdar, b. A set of operations is defined through which the minimal test set for detecting stuckat faults is obtained from the compressed fault table. In mathematical terms, the each output is a function of the inputs. Fault tolerant design of combinational and sequential logic based on a parity check code sobeeh almukhaizim and yiorgos makris electrical engineering department yale university sobeeh. Design of selftesting and online fault detection combinational circuits with weakly independent outputs. The method is based on automatically designing a circuit which. Acknowledgements i would like to thank professor andreas veneris for his diligent supervision and for his inspiring enthusiasm for academic research. Clearly, the number of fault pairs is much larger than the number of faults thus making this problem very difficult and challenging. Us100296b2 method of fault tolerance in combinational. Later, we will study circuits having a stored internal state, i. The method is based on automatically designing a circuit which implements a closestmatch fault location algorithm specialized for the circuit under diagnosis cud.
Me vlsi design materials,books and free paper download. Functional fault equivalence and diagnostic test generation in combinational logic circuits using conventional atpg andreas veneris1. Removal of redundancy in combinational circuits under classification of undetectable faults. Fault detection and diagnostic test set minimization. This paper proposes and evaluates a logic level faulttolerant method based on parity for designing combinational circuits. A tsc evaluation function for combinational circuits. Fault detection and diagnostic test set minimization mohammed ashfaq shukoor master of science, may 9, 2009 b.
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